ON THE ACCURACY OF ELEMENT CONCENTRATIONS AND MASSES OF MICRON-SIZED SAMPLES DETERMINED WITH THE HEIDELBERG PROTON MICROPROBE

We have already tested the reliability of element-normalized PIXE (Pro ton Induced X-ray Emission) data on small (10-100 mu m) particles that we routinely obtain with the Heidelberg proton microprobe. Thus, we h ere discuss the accuracy of quantitative results, i.e., absolute conce ntrations inferred from PIXE analyses of such particles. We investigat ed and reduced the effects of mechanical vibrations and of the instabi lity of the electronic devices on the achievable minimum beam spot. We implemented into our computer code a mapping software for qualitative element distributions (PIXE) and quantitative mass images using STIM (Scanning Transmission Ion Microscopy). The STIM images determine the area density required to calculate from PIXE spectra the absolute elem ent concentrations in thin samples. The accuracy of absolute PIXE conc entrations is tested by measurements on 15 mu m soda lime glass micros pheres. Finally, the complete results of PIXE and STIM analyses of an interplanetary dust particle (IDP) are described.