A SCANNING POSITRON MICROSCOPE FOR DEFECT ANALYSIS IN MATERIALS SCIENCE

Authors
TRIFTSHAUSER W KOGEL G SPERR P BRITTON DT UHLMANN K WILLUTZKI P
Citation
W. Triftshauser et al., A SCANNING POSITRON MICROSCOPE FOR DEFECT ANALYSIS IN MATERIALS SCIENCE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 264-269
Citations number
20
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
130
Issue
1-4
Year of publication
1997
Pages
264 - 269
Database
ISI
SICI code
0168-583X(1997)130:1-4<264:ASPMFD>2.0.ZU;2-W
Abstract
The realisation of a scanning positron microscope will be presented an d discussed. A positron beam with a variable energy from 0.5 to 30 keV , with a spot diameter of 1 mu m or below, can be scanned over an area of 0.6 x 0.6 mm(2). This beam is formed after a double stage stochast ic cooling (moderation) of positrons emitted from a radioactive isotop e. In addition the positron beam will be pulsed in order to have a wel l-defined time base for positron lifetime measurements. In the system included is a conventional scanning electron microprobe for surface an alysis. The design of the scanning positron microscope is dominated by the special demands of positron physics.