SIMULTANEOUS IMAGING OF UPSET-SENSITIVE AND LATCHUP-SENSITIVE REGIONSIN A STATIC RAM

Authors
FISCHER BE SCHLOGL M BARAK J ADLER E METZGER S
Citation
Be. Fischer et al., SIMULTANEOUS IMAGING OF UPSET-SENSITIVE AND LATCHUP-SENSITIVE REGIONSIN A STATIC RAM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 478-485
Citations number
4
Categorie Soggetti
Physics, Nuclear","Nuclear Sciences & Tecnology","Instument & Instrumentation
Journal title
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms → ACNP
ISSN journal
0168583X
Volume
130
Issue
1-4
Year of publication
1997
Pages
478 - 485
Database
ISI
SICI code
0168-583X(1997)130:1-4<478:SIOUAL>2.0.ZU;2-U
Abstract
Using the GSI heavy ion microprobe and a special hardware circuit for upset and latchup detection we have-for the first time simultaneously imaged upset-and latchup-sensitive regions of a 2k x 8 bit static RAM (HM 65162) for different LET values of the beam and various operating voltages. Additionally we have mapped the scanned area by secondary el ectron imaging and ion induced charge imaging to create a data set as comprehensive as possible for the description of single event processe s.