T. Hirao et al., EFFECT OF ION POSITION ON SINGLE-EVENT TRANSIENT CURRENT, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 486-490
Using focused high-energy microbeams of carbon-and oxygen-ions and a h
igh speed, wide bandwidth measurement system, we found a strong depend
ence of the collected charge and the transient current waveform on the
position of ion incidences. Single-event charge is collected by a dif
fusion mechanism even when the ion strikes a position about 3 similar
to 4 mu m away from the lateral boundary of the p(+) n-junction area.
(C) 1997 Elsevier Science B.V.