CURRENT-VOLTAGE CHARACTERISTICS OF SELF-ASSEMBLED MONOLAYERS BY SCANNING-TUNNELING-MICROSCOPY

Citation
S. Datta et al., CURRENT-VOLTAGE CHARACTERISTICS OF SELF-ASSEMBLED MONOLAYERS BY SCANNING-TUNNELING-MICROSCOPY, Physical review letters, 79(13), 1997, pp. 2530-2533
Citations number
19
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
79
Issue
13
Year of publication
1997
Pages
2530 - 2533
Database
ISI
SICI code
0031-9007(1997)79:13<2530:CCOSMB>2.0.ZU;2-R
Abstract
This paper presents a comparison of the theoretical and experimental c urrent-voltage (I-V) characteristics of a self-assembled monolayer of alpha,alpha'-xylyl dithiol molecules on a gold substrate measured with a scanning tunneling microscope probe. Good quantitative agreement is obtained with the tip-molecule distance as the only ''fitting paramet er. Several other thiol-coupled molecules that we have studied also sh ow similar agreement. The conceptual picture presented in this paper c ould be useful for the interpretation of I-V measurements on molecular monolayers in general.