Images of films (500-1100 angstrom thick) of several nonconducting pol
ymers, spin cast on Au-coated silicon wafers, have been obtained with
a scanning tunneling microscope (STM). Imaging was not possible if fil
ms were cast on SiO2 and depends on scan rate: when a critical value w
as exceeded, the image became grossly degraded and a damaged spot unde
r the tip was optically visible. The damage threshold was generally hi
gher for Pt/Ir tips than for ion-implanted diamond. Damage was not obs
erved when stable, repeatable images were obtained; these showed mean
roughness of approximately 5 angstrom, and 10-50-angstrom undulations
100-300 angstrom wide. Atomic force microscopy (AFM) images were also
obtained and confirm the STM data. Grooves several nanometers deep wer
e formed and imaged with the same tip (ion-implanted diamond), without
tip degradation. The mechanism of imaging is postulated to involve a
combination of field-assisted electron transfer and pressure-induced e
ffects.