PAIRING BETWEEN RADIOACTIVE SOLUTES AND POINT-DEFECTS IN SEMICONDUCTORS

Authors
Citation
T. Wichert, PAIRING BETWEEN RADIOACTIVE SOLUTES AND POINT-DEFECTS IN SEMICONDUCTORS, Berichte der Bunsengesellschaft fur Physikalische Chemie, 101(9), 1997, pp. 1274-1281
Citations number
18
Categorie Soggetti
Chemistry Physical
Journal title
Berichte der Bunsengesellschaft fur Physikalische Chemie
ISSN journal
00059021 → ACNP
Volume
101
Issue
9
Year of publication
1997
Pages
1274 - 1281
Database
ISI
SICI code
0005-9021(1997)101:9<1274:PBRSAP>2.0.ZU;2-7
Abstract
The study of solute point-defect interactions in crystals is performed on an atomic scale by employing radioactive solutes as local observer s. Thereby, the presence of a point-defect next to the solute atom bec omes observable via the altered electronic charge distribution about t he solute, giving rise to a defect-specific electric field gradient. U sing the perturbed gamma gamma angular correlation technique, this ele ctric field gradient is detected via the hyperfine interaction occurri ng at the site of the nucleus of the radioactive atom. The sensitivity to solute point-defect pairs is typically in the order of 10(16)cm(-3 ). Several properties of these pairs, such as their chemical nature an d thermodynamical behaviour are discussed. The point-defects addressed in this paper are intrinsic, such as lattice vacancies, and extrinsic , such as substitutional and interstitial impurity atoms. Results for the elemental semiconductor Si and different II-VI compound semiconduc tors will be discussed.