The breakdown mechanism of chemical vapor deposited nickel (CVD Ni) co
ated with 5 micrometers of diamond-like carbon (DLC) produced by plasm
a source ion implantation (PSII) in chloride solution was investigated
. PSII differs from traditional implantation techniques in that the ta
rgets are placed directly in a plasma source and then pulse biased to
produce a non-line-of-sight process to complex-shaped targets without
complex fixturing. Electrochemical Impedance Spectroscopy (EIS) measur
ements indicated the presence of small pores in the DLC presumably for
med in the deposition process. These pores were also observed in the s
canning electron microscope. These pores exposed a layer of CVD Ni imp
lanted with carbon (C). EIS results were analyzed within the context o
f an equivalent circuit model which incorporated three time constants
representing the Ni-C implant layer, the DLC/solution interface, and t
he pore/solution interface. Good correlation between CNLS fitting of t
he impedance data and this circuit model was obtained. Upon immersion
in chloride solution, the onset of breakdown of the DLC coating was ra
pid. Breakdown failed to initiate in chloride solution buffered with s
odium berate. Mixed potential theory was used to describe these result
s and mechanisms for the initiation and propagation of coating failure
in chloride solutions. Published by Elsevier Science Ltd.