F. Verpoort et al., SIO2 SI(100) MODEL SUPPORT WITH AES AND XPS IN COMBINATION WITH MLCFA/, Journal of the Chemical Society. Faraday transactions, 93(19), 1997, pp. 3555-3562
Citations number
37
Categorie Soggetti
Chemistry Physical","Physics, Atomic, Molecular & Chemical
Model supports consisting of a thin layer of SiO2, on a silicon single
crystal offer tremendous advantages for the study of heterogeneous ca
talysts. Using model supports, the use of angle-resolved and depth pro
filing X-ray photoelectron spectroscopy has now become meaningful. The
Varimax Promax transformation (VPT) technique for maximum likelihood
common factor analysis (MLCFA) has been proposed as an alternative met
hod to the traditional transformations. The so-called VPT technique ma
kes no use of spectral reference libraries. Both MLCFA and VPT are inc
orporated in a factor analysis software package which has been applied
, in combination with XPS and AES, to the study of thin layers of SiO2
on Si(100).