I. Takeuchi et al., LOW-TEMPERATURE SCANNING-TIP MICROWAVE NEAR-FIELD MICROSCOPY OF YBA2CU3O7-X FILMS, Applied physics letters, 71(14), 1997, pp. 2026-2028
We have explored the low temperature capability of a scanning-tip micr
owave near-field microscope to study superconductors. The shift in the
quality factor of the microscope resonator can be used to obtain the
temperature dependence of the surface resistance of a local region und
er the tip. Patterned YBa2Cu3O7-x films were scanned at various temper
atures and surface resistance mapping was performed with high spatial
resolution at 1.2 GHz. Superconducting transitions at different positi
ons on a film can be detected. Edge-region defects in wet-etched patte
rns were observed and were shown to be nonsuperconducting at microwave
frequencies at 80 K. (C) 1997 American Institute of Physics.