LOW-TEMPERATURE SCANNING-TIP MICROWAVE NEAR-FIELD MICROSCOPY OF YBA2CU3O7-X FILMS

Citation
I. Takeuchi et al., LOW-TEMPERATURE SCANNING-TIP MICROWAVE NEAR-FIELD MICROSCOPY OF YBA2CU3O7-X FILMS, Applied physics letters, 71(14), 1997, pp. 2026-2028
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
14
Year of publication
1997
Pages
2026 - 2028
Database
ISI
SICI code
0003-6951(1997)71:14<2026:LSMNMO>2.0.ZU;2-H
Abstract
We have explored the low temperature capability of a scanning-tip micr owave near-field microscope to study superconductors. The shift in the quality factor of the microscope resonator can be used to obtain the temperature dependence of the surface resistance of a local region und er the tip. Patterned YBa2Cu3O7-x films were scanned at various temper atures and surface resistance mapping was performed with high spatial resolution at 1.2 GHz. Superconducting transitions at different positi ons on a film can be detected. Edge-region defects in wet-etched patte rns were observed and were shown to be nonsuperconducting at microwave frequencies at 80 K. (C) 1997 American Institute of Physics.