O. Yamamoto et al., NUMERICAL DESIGN OF HV INSULATORS BASED ON CHARGE ACCUMULATION IN VACUUM, IEEE transactions on dielectrics and electrical insulation, 4(4), 1997, pp. 413-417
A MCS (Monte Carlo simulation) method of charge accumulation based on
the SEEA (secondary emission electron avalanche) mechanism is applied
to the design of effective corrugation on an insulator surface used in
vacuum. The electric field distribution on cathode in the vicinity of
a triple junction is analyzed taking the SEEA charge accumulation int
o account. Considerable relaxation of field strength takes places due
to negative charge accumulation with appropriate corrugation. The flas
hover voltage obtained experimentally increases as the field strength
decreases. The result of the MCS thus agrees well with the experimenta
l result.