Statistical tools have been developed for performing Bayesian analysis
of electrical failures in the case of two-parameter distributions. So
ftware implementations graphically present confidence regions for the
two parameters and confidence intervals for the failure probability as
a function of applied stresses. For the Normal and Lognormal distribu
tions these are the same as classical confidence regions, while for Gu
mbel and Weibull distributions they are nearly the same. Examples are
provided for the energy capacity of metal-oxide varistors and for insu
lator flashover probability.