EVALUATION OF AN AXIALLY AND RADIALLY VIEWED INDUCTIVELY-COUPLED PLASMA USING AN ECHELLE SPECTROMETER WITH WAVELENGTH MODULATION AND 2ND-DERIVATIVE DETECTION

Citation
Y. Nakamura et al., EVALUATION OF AN AXIALLY AND RADIALLY VIEWED INDUCTIVELY-COUPLED PLASMA USING AN ECHELLE SPECTROMETER WITH WAVELENGTH MODULATION AND 2ND-DERIVATIVE DETECTION, Journal of analytical atomic spectrometry, 9(7), 1994, pp. 751-757
Citations number
10
Categorie Soggetti
Spectroscopy
ISSN journal
02679477
Volume
9
Issue
7
Year of publication
1994
Pages
751 - 757
Database
ISI
SICI code
0267-9477(1994)9:7<751:EOAAAR>2.0.ZU;2-P
Abstract
A high-dispersion echelle spectrometer which incorporates wavelength m odulation and second-derivative signal detection is used to view analy te emission from an inductively coupled plasma in both the axial (end- on) and radial (side-on) configurations. Movement of the plasma torch assembly between the viewing positions is computer controlled. Perform ance characteristics such as background intensity, repeatability, back ground equivalent concentration, limit of detection, dynamic range and interference effects are reported for 24 elements and in general, mea surement in the end-on position produces an improvement in sensitivity . Using end-on measurement, the system is applied to the multi-element analysis of a certified reference water.