New cuprate compounds have been synthesized by Sequentially Imposed Mo
lecular Beam Epitaxy on MgO(100) substrates. The composition of the fi
lms corresponds to Cah-1Cuh+1O2h with h = 3. We present X-ray diffract
ion measurements performed with synchrotron radiation on a four circle
s diffractometer. These films crystallize in an orthorhombic structure
with a single orientation perpendicular to the substrate surface. The
value of a and b parameters are in agreement with the two-leg ladder
structure of the Cu2O3 planes, also observed by HREM.