Z-SCAN MEASUREMENTS WITH FOURIER-ANALYSIS IN ION-DOPED SOLIDS

Citation
Cr. Mendonca et al., Z-SCAN MEASUREMENTS WITH FOURIER-ANALYSIS IN ION-DOPED SOLIDS, Applied physics letters, 71(15), 1997, pp. 2094-2096
Citations number
21
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
15
Year of publication
1997
Pages
2094 - 2096
Database
ISI
SICI code
0003-6951(1997)71:15<2094:ZMWFII>2.0.ZU;2-Z
Abstract
We report on the measurement of nonlinear refraction in ion-doped soli ds with a method that combines the single-beam Z-scan technique and a Fourier analysis of the transmittance time evolution. The laser beam i s modulated at a frequency f and the Fourier components at f and 2f ar e shown to be related, respectively, to Linear and nonlinear refractio ns, Their ratio is used to eliminate spurious Linear effects as a way of increasing the sensitivity of the measurement, with this method we are able to measure nonlinear phase changes of a few tens of mrad, cor responding to wave front distortions smaller than lambda/10(5). Moreov er, the technique can discriminate nonlinear processes with different relaxation times. (C) 1997 American Institute of Physics.