H. Greif et al., HIGH-RESOLUTION POSITRON-ANNIHILATION SPECTROSCOPY WITH A NEW POSITRON MICROPROBE, Applied physics letters, 71(15), 1997, pp. 2115-2117
In cooperation with Zeiss/LEO GmbH, a monoenergetic positron source ha
s been integrated in the electron optical system of a scanning electro
n microscope by help of a magnetic prism, The electron optics serves b
oth to image the specimen with electrons and to form a positron microb
eam that allows local positron-annihilation measurements with a resolu
tion in the micron range. The fatigue damage profile along the cross s
ection of a copper plate after a three-point bending test has been inv
estigated. The obtained S-parameter profile coincides well with the ex
pected fatigue damage distribution. (C) 1997 American Institute of Phy
sics.