Carbon ions at an energy of 35 keV with a dose of 5 X 10(16) cm(-2) we
re implanted into SiNxOy films grown on crystalline silicon by plasma
enhanced chemical vapor deposition. Intense photoluminescence (PL) pea
ked at about 550 nm is observed in the implanted films under an excita
tion of 441.6 nm laser line. The PL intensity varies with annealing te
mperature, and reaches a maximum at the annealing temperature of 600 d
egrees C. The luminescence may originate from the complex of Si, N, O,
and C in the films. (C) 1997 American Institute of Physics.