Ct. Blue et al., INVESTIGATION OF CRYSTALLOGRAPHIC AND BULK STRAIN IN DOPED LEAD MAGNESIUM NIOBATE, Journal of applied physics, 82(8), 1997, pp. 3972-3975
Using an in situ x-ray diffraction (XRD) technique, the electric-field
induced change in the d-spacings Delta d/d of the individual microcry
stals or ''crystallographic'' strain is measured on lead magnesium nio
bate-lead titanate-barium titanate electrostrictive ceramics of compos
ition 0.970(0.900PMN-0.100PT)-0.030BT from zero field to saturation. T
his crystallographic strain is then compared to the bulk longitudinal
strain as measured by Delta l/l using a photonic sensor. The crystallo
graphic electric-field induced strain behavior for virgin samples coul
d be fit to a constitutive model, where the induced strain is proporti
onal to the square of the polarization with an electrostrictive coeffi
cient Q determined to be 1.4 (x 10(6) cm(4)/C-2). Attempts to fit the
bulk strain behavior on the same sample required lower values of the e
lectrostrictive coefficient Q similar to 1, and generally yielded wors
e fits where the model predicted greater than the observed strain valu
es at low electric fields. Subsequent in situ XRD measurements on prev
iously electric-field cycled samples yielded much lower crystallograph
ic strain values with a significantly different electric field depende
nce. (C) 1997 American Institute of Physics.