THE RELATIONSHIP OF THE CRITICAL-CURRENT DENSITY AND THE LATTICE DEFORMATION IN Y1-XREXBA2CU3O7-DELTA EPITAXIAL-FILMS

Authors
PENG ZS HAO JM YIN B ZHAO ZX HUA ZQ YANG BC
Citation
Zs. Peng et al., THE RELATIONSHIP OF THE CRITICAL-CURRENT DENSITY AND THE LATTICE DEFORMATION IN Y1-XREXBA2CU3O7-DELTA EPITAXIAL-FILMS, Physica. C, Superconductivity, 282, 1997, pp. 2103-2104
Citations number
7
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
282
Year of publication
1997
Part
4
Pages
2103 - 2104
Database
ISI
SICI code
0921-4534(1997)282:<2103:TROTCD>2.0.ZU;2-T
Abstract
The critical current densities Jc of Y1-xRExBa2Cu3O7-delta (RE=Ho, Dy and Eu) epitaxial thin films with x=0,0.2,0.4,0.7,1.0 at various tempe ratures and magnetic fields have been measured magnetically. XRD resul ts showed that the more serious the lattice deformation, the higher th e Jc of the films becomes, have been observed by the width of the X-ra y reflections. These results demonstrated the stress field pinning ind uced by the lattice deformation in RE-doped Y1-xRExBa2Cu3O7-delta epit axial thin films.