BULK PINNING BY PLANAR DEFECTS IN TI-DOPED BI-2212 SINGLE-CRYSTALS

Authors
DROST RJ LI TW KES PH SURDEANU R WIJNGAARDEN RJ KONCZYKOWSKI M
Citation
Rj. Drost et al., BULK PINNING BY PLANAR DEFECTS IN TI-DOPED BI-2212 SINGLE-CRYSTALS, Physica. C, Superconductivity, 282, 1997, pp. 2241-2242
Citations number
2
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
282
Year of publication
1997
Part
4
Pages
2241 - 2242
Database
ISI
SICI code
0921-4534(1997)282:<2241:BPBPDI>2.0.ZU;2-E
Abstract
We demonstrate that Ti-doping in Bi2Sr2CaCu2O8+x (Bi-2212) single crys tals results in significantly enhanced pinning properties due to the f ormation of a peculiar planar defect strucure induced by the dopant.