The magneto-optical technique was used to study the edge barrier for f
lux entry in type I superconducting strips (In, ph). The width of the
flux-free zones appearing at the sample edges, due to the barrier, was
measured at different applied fields and temperatures. Standard I-V m
easurements allowed us to study the critical current originated by the
edge barrier in these pinning-free samples and its dependence on diff
erent parameters like magnetic field, temperature and sample's size. O
ur results confirm the geometrical origin of this edge barrier and sho
w its dependence on different relevant variables.