We present experimental results on YBCO thin film bi-crystal junctions
in which additional metallic shunt resistors are added by in-situ thi
n film evaporation of gold or silver. The current-voltage characterist
ics have been measured, as well as the broad band noise in the system
between 1 Hz and 100 kHz, using a HTS de SQUID as a low-noise preampli
fier. The influence of the shunt resistors on the excess noise contrib
utions is discussed and the measured shunt resistance results are comp
ared with a resistive network model.