THICKNESS DEPENDENCE OF THE THERMOELECTRIC VOLTAGES IN YBACUO7-DELTA THIN-FILMS ON TILTED SUBSTRATE OF SRTIO3

Authors
ZHANG PX STICHER U LEIBOLD B HABERMEIER HU
Citation
Px. Zhang et al., THICKNESS DEPENDENCE OF THE THERMOELECTRIC VOLTAGES IN YBACUO7-DELTA THIN-FILMS ON TILTED SUBSTRATE OF SRTIO3, Physica. C, Superconductivity, 282, 1997, pp. 2551-2552
Citations number
8
Categorie Soggetti
Physics, Applied
Journal title
Physica. C, Superconductivity → ACNP
ISSN journal
09214534
Volume
282
Year of publication
1997
Part
4
Pages
2551 - 2552
Database
ISI
SICI code
0921-4534(1997)282:<2551:TDOTTV>2.0.ZU;2-K
Abstract
We report the first measurements of the thickness (d) dependence of th e thermoelectric voltages (V-x) from YBa2Cu3O7-delta (YBCO) films depo sited on tilted SrTiO3 (STO) substrate. It was found that the linear r elation of V-x vs. 1/d predicted by the atomic layer thermopile (ALTP) model is followed only at rather thick film region; Instead of a mono tonic increase, a maximum of the thermoelectric voltage was measured. A model, which takes the influence of the surface and interface defect s into consideration, is put forward and discussed.