TRANSMISSION ELECTRON-MICROSCOPIC STUDY OF GRAIN-BOUNDARIES IN (BI,PB)(2)SR2CA2CU3OX SILVER-SHEATHED TAPES

Citation
Dp. Grindatto et al., TRANSMISSION ELECTRON-MICROSCOPIC STUDY OF GRAIN-BOUNDARIES IN (BI,PB)(2)SR2CA2CU3OX SILVER-SHEATHED TAPES, Physica. C, Superconductivity, 282, 1997, pp. 2571-2572
Citations number
5
Categorie Soggetti
Physics, Applied
ISSN journal
09214534
Volume
282
Year of publication
1997
Part
4
Pages
2571 - 2572
Database
ISI
SICI code
0921-4534(1997)282:<2571:TESOGI>2.0.ZU;2-0
Abstract
The grain boundaries in high-j(c) (Bi,Pb)(2)Sr2Ca2Cu3Ox silver-sheathe d tapes have been investigated using transmission electron microscopy (TEM). Two basic types of boundaries have been observed. Both types pe rmit the outstanding supercurrent transport over macroscopic distances . The observed grain boundaries are found to not be accompanied by amo rphous material and intergranular phases, even when they are totally i ncoherent.