Sw. Hell et M. Kroug, GROUND-STATE-DEPLETION FLUORESCENCE MICROSCOPY - A CONCEPT FOR BREAKING THE DIFFRACTION RESOLUTION LIMIT, Applied physics. B, Lasers and optics, 60(5), 1995, pp. 495-497
We introduce and study a novel concept in farfield fluorescence micros
copy fundamentally overcoming the classical diffraction resolution lim
it. This is accomlished by reducing the spatial extent of the effectiv
e focus of a scanning fluorescence microscope. The reduction is achiev
ed by depleting the ground-state energy of the molecules located in th
e outer region of the focus. Our theoretical study shows that ground-s
tate-depletion fluorescence microscopy has the potential of increasing
the resolution of far-held fluorescence microscopy by an order of mag
nitude which is equivalent to a lateral resolution of 15 NM.