A theoretical model of the electronic current instability observed exp
erimentally by Bredikhin et al. in the cell Ag(-)/RbAg4I5/C(+) at vari
ous constant voltages is proposed. The model is based on the concept o
f fractal growth of silver dendritic clusters from the Ag(-)/RbAg4I5 i
nterface. It is shown that some of the clusters make connections betwe
en opposite electrodes at sufficiently large voltages, which leads to
stochastic current oscillations. We show that the number of connecting
clusters increases as the voltage is raised and therefore current osc
illations become more frequent. All experimental dependences on curren
t instability are well described within the framework of a mean-field
approach to the theory of reversible diffusion-limited aggregation wit
hout branching.