MACRO FILE AND DESIGN WINDOW COMPRESSION LOAD-PULL MEASUREMENTS

This article describes measurement and evaluation algorithms that allo w full load pull tests to be performed while driving transistors autom atically into desired gain compression and measuring a selection of pa rameters, such as output power, gain, efficiency, intermodulation, adj acent-channel power (ACP), DC bins and harmonic loads, as a function o f input power. The Design Window evaluation software identifies load c onditions for which a set of design requirements are fulfilled simulta neously. Examples of measured contours and three-dimensional surface p lots are included.