ELECTROCHEMICAL ETCHING OF POROUS SILICON SACRIFICIAL LAYERS FOR MICROMACHINING APPLICATIONS

Citation
M. Navarro et al., ELECTROCHEMICAL ETCHING OF POROUS SILICON SACRIFICIAL LAYERS FOR MICROMACHINING APPLICATIONS, Journal of micromechanics and microengineering, 7(3), 1997, pp. 131-132
Citations number
3
Categorie Soggetti
Engineering, Eletrical & Electronic","Engineering, Mechanical
ISSN journal
09601317
Volume
7
Issue
3
Year of publication
1997
Pages
131 - 132
Database
ISI
SICI code
0960-1317(1997)7:3<131:EEOPSS>2.0.ZU;2-7
Abstract
Using porous silicon (PS) as a thick sacrificial layer, free-standing structures at a large distance from the bulk can be obtained. The very high specific surface of PS makes its removal using dilute alkaline s olutions possible. In this work different technological conditions, su ch as adding ethanol or ultrasonic stirring, are studied in order to o ptimize the removal of PS using a one-step process with 0.1% KOH solut ion. Finally, cathodic polarization of the sample during the removal p rocess is proposed as a method to enhance and improve the etching of P S whilst avoiding possible oxide formation. This electrochemical etchi ng of a PS sacrificial layer allows good quality free-standing polysil icon structures featuring a smooth substrate to be obtained.