OBSERVATION OF MICRO-INCLUSIONS IN DIAMOND BY SCANNING-X-RAY ANALYTICAL MICROSCOPE

Authors
SHIMOMURA S KANDA H NAKAZAWA H
Citation
S. Shimomura et al., OBSERVATION OF MICRO-INCLUSIONS IN DIAMOND BY SCANNING-X-RAY ANALYTICAL MICROSCOPE, DIAMOND AND RELATED MATERIALS, 6(11), 1997, pp. 1680-1682
Citations number
7
Categorie Soggetti
Material Science
Journal title
DIAMOND AND RELATED MATERIALS → ACNP
ISSN journal
09259635
Volume
6
Issue
11
Year of publication
1997
Pages
1680 - 1682
Database
ISI
SICI code
0925-9635(1997)6:11<1680:OOMIDB>2.0.ZU;2-Q
Abstract
Micro-inclusions in a synthetic diamond were successfully observed by a scanning X-rag; analytical microscope (XSAM), a system for mapping t he intensity distributions of the fluorescent and transmitted X-rays o f the sample irradiated by an X-ray microbeam (3 mm). Fluorescent X-ra y micrographs showed that micro-inclusions contained cobalt element. T he present experiment demonstrates well the capability of the SXAM as a tool for the study of micro-inclusions in synthetic diamond. (C) 199 7 Elsevier Science S.A.