P. Tackx et F. Bosscher, SYSTEMATIC DEVIATIONS DUE TO RANDOM NOISE-LEVELS IN SIZE-EXCLUSION CHROMATOGRAPHY COUPLED WITH MULTI ANGLE LASER-LIGHT SCATTERING, Analytical communications, 34(10), 1997, pp. 295-297
Starting from a theoretical molar mass distribution (generalized expon
ential distribution), the concentration and light scattering chromatog
rams of a size exlusion chromatography coupled with multi angle laser
light scattering experiment are constructed with random noise levels.
From these noisy curves, a log M versus retention volume plot is creat
ed. This plot shows a systematic deviation in the low and high molar m
ass region. In the low molar mass region (poor light scattering signal
s), the log M signals are systematically too high. In the high molar m
ass region (poor concentration signals), the log M signals are constan
tly too low. We show that this systematic error is due to the fact tha
t the logarithm of negative numbers is not defined.