Ac. Caballero et al., DOPANT DISTRIBUTION AND GRAIN-GROWTH CONTROL IN BATIO3 CERAMICS DOPEDWITH ZNO-SIO2-P2O5, Journal of the European Ceramic Society, 17(10), 1997, pp. 1223-1230
In the present work, high-density BaTiO3 ceramics with homogeneous fin
e-grained microstructure have been obtained by incorporating small amo
unts of SiO2, P2O5 and ZnO and sintering at temperatures between 1175
and 1225 degrees C. Dilatometry and porosimetry tests showed that sint
ering starts at higher temperature (around 200 degrees C higher) for t
he doped material. As a consequence, for the doped material porosity c
oalescence and removal is promoted while grained growth is inhibited d
uring the first sintering step. SEM and TEM analysis did not reveal an
y secondary phases in the microstructure of the samples sintered below
1250 degrees C. Grain growth control and microstructural homogeneity
seem related to the dopant distribution. XPS analysis showed that the
dopants are distributed on the surface of the BaTiO3 particles before
the temperature at which sintering starts is reached. The behaviour of
the Curie temperature indicates that dopants are incorporated as a so
lid solution after sintering below 1250 degrees C. this incorporation
may lead to compositional changes at the grain boundaries which would
be the origin of the lower AC grain boundary which would be the origin
of the lower AC grain boundary conductivity measured by complex imped
ance analysis nd the observed low dielectric losses (well below 1%) of
the doped samples. The dielectric characteristics of the doped materi
als, and the flat dependence of the permittivity with the temperature,
make these materials very promising ones for X7R applications. (C) 19
97 Elsevier Science Limited.