THE MEASUREMENT OF THE RMS EMITTANCE OF AN ION-BEAM WITH AN ARBITRARYDENSITY PROFILE

Authors
PANDIT VS SARMA PR BHATTACHARYA S BHANDARI RK
Citation
Vs. Pandit et al., THE MEASUREMENT OF THE RMS EMITTANCE OF AN ION-BEAM WITH AN ARBITRARYDENSITY PROFILE, Measurement science & technology, 8(10), 1997, pp. 1085-1089
Citations number
12
Categorie Soggetti
Instument & Instrumentation",Engineering
Journal title
Measurement science & technology → ACNP
ISSN journal
09570233
Volume
8
Issue
10
Year of publication
1997
Pages
1085 - 1089
Database
ISI
SICI code
0957-0233(1997)8:10<1085:TMOTRE>2.0.ZU;2-O
Abstract
A simple method to evaluate the RMS beam emittance is described. We ob tained a relation between the beam parameters and the RMS width of the profile which can be measured by a beam profile monitor and this rela tion was used to determine the RMS beam emittance. This method is appl icable to beams with any kind of density distribution in the phase spa ce.