Sample rotation combined with Fourier transform (FT)-Raman spectroscop
y usually results in spectra severely distorted by a double modulation
of the scattered light emitted by the substance under study. In the c
ase of accurately aligned solid samples, the disturbance modulation is
mainly due to an optical inhomogeneity of the surface, e.g., a certai
n surface roughness. The application of the step-scan technique permit
s the laterally resolved investigation of rotating samples when the mo
vement of the interferometer mirror of the FT-Raman spectrometer is sy
nchronized to the rotation of the sample, Routine FT near-infrared (NI
R) Raman spectroscopic measurements of thermally sensitive and inhomog
eneous solid samples that require the application of a spinning-sample
arrangement become possible, Moreover, information about the angular
dependence of the physical and chemical surface composition of the sol
id samples, i.e., a lateral resolution, can be obtained.