Y. Xie et Q. Hao, EVALUATION OF REFLECTION INTENSITIES FOR THE COMPONENTS OF MULTIPLE LAUE DIFFRACTION SPOTS BY THE MAXIMUM-ENTROPY METHOD, Acta crystallographica. Section A, Foundations of crystallography, 53, 1997, pp. 643-648
In a Laue diffraction pattern, 10-20% of the spots result from the exa
ct superposition of two or more reflections that are 'harmonics'; a hi
gh proportion of these are low-resolution reflections. For the solutio
n of large or difficult structural problems, the intensities of the re
maining 80-90% of the reflections, measurable as singles, may not be s
ufficient and thus the evaluation of the intensities of the components
of the multiple spots is important. A new method for this deconvoluti
on is presented that is based on maximizing the entropy of the Patters
on function subject to the constraints imposed by the observed intensi
ties of single and overlapping reflections. This method does not requi
re data redundancy and therefore is of particular interest for time-re
solved studies on a short time scale. A new computer program (ME) was
implemented and tested with Laue diffraction data from hen egg white l
ysozyme. The R factor between the deconvoluted reflection intensities
from Laue multiple spots and observed intensities from monochromatic d
ata was 0.116.