ELECTROLYTE LEAKAGE IN SEEDS, ROOTS AND LEAVES OF COTTON AND SOYBEAN AT OPTIMAL AND SUPEROPTIMAL TEMPERATURES

Leaves, roots and seeds of soybean and cotton were subjected to a seri es of temperature stress of 30, 34, 38, 42, 46 and 50 degrees C to mea sure the ion efflux from the cell. Soybean leaves leaked more electrol ytes at 313 mu S/cm than cotton leaves which recorded the electrical c onductivity of 143 mu S/cm at 50 degrees C. Below the stress at 42 deg rees C relatively less ions were effluxed as compared to 42 degrees C or above where severe damage to cell membrane occurred and more than 5 0% electrolytes leaked from leaves, seeds and roots of both crop plant s.