G. Chiorboli et al., TEST OF SUBRANGING A D CONVERTERS WITH DIGITAL CORRECTION/, IEEE transactions on instrumentation and measurement, 46(4), 1997, pp. 975-979
A test methodology based on linear modeling of subranging analog-to di
gital converters with digital correction ANALOG is proposed, A reduced
physical model of integral nonlinearity INPUT errors is obtained by t
he application of the ambiguity algorithm. Simulation results are prov
ided which demonstrate that an appreciable reduction of the number of
test points can be obtained, thus reducing the high costs of testing,
with low prediction errors.