L. Roy et al., MEASUREMENT TECHNIQUES FOR INTEGRATED-CIRCUIT SLOT ANTENNAS, IEEE transactions on instrumentation and measurement, 46(4), 1997, pp. 1000-1004
Techniques for on-wafer integrated antenna measurement are presented,
Two novel techniques and associated apparatus are developed specifical
ly for the measurement of input impedance and radiation pattern of 20
GHz to 30 GHz slot antennas integrated onto GaAs wafers, Both draw upo
n equipment already used for nonradiating integrated circuits, i.e., a
wafer-prober system, but involve significant modifications, The resul
ting setups are validated using a numerical electromagnetic analysis t
ool which shows the effect of the measurement fixtures on the experime
ntal results. Finally, some examples of measured data are given to ill
ustrate the usefulness of the techniques.