NITRIDE LAYERS FOR PROSTHETIC IMPLANTS - DEPTH-RESOLVED ANALYSIS OF NONMETALS IN ALLOYS BY RADIOFREQUENCY GLOW-DISCHARGE ATOMIC-EMISSION SPECTROSCOPY

Authors
HARTENSTEIN ML COMPTON RC MARCUS RK
Citation
Ml. Hartenstein et al., NITRIDE LAYERS FOR PROSTHETIC IMPLANTS - DEPTH-RESOLVED ANALYSIS OF NONMETALS IN ALLOYS BY RADIOFREQUENCY GLOW-DISCHARGE ATOMIC-EMISSION SPECTROSCOPY, American laboratory, 29(20), 1997, pp. 17
Citations number
13
Categorie Soggetti
Instument & Instrumentation","Chemistry Analytical
Journal title
American laboratory → ACNP
ISSN journal
00447749
Volume
29
Issue
20
Year of publication
1997
Database
ISI
SICI code
0044-7749(1997)29:20<17:NLFPI->2.0.ZU;2-I
Abstract
Radiofrequency glow discharge analysis provides a means of performing depth-resolved analyses of non-conductive layers or base materials. Th e example described here is the analysis of nitrogen In nitride layers .