AGING PROPERTIES OF HIGH-POWER LASER-DIODE ARRAYS ANALYZED BY FOURIER-TRANSFORM PHOTOCURRENT MEASUREMENTS

Authors
TOMM JW JAEGER A BARWOLFF A ELSAESSER T GERHARDT A DONECKER J
Citation
Jw. Tomm et al., AGING PROPERTIES OF HIGH-POWER LASER-DIODE ARRAYS ANALYZED BY FOURIER-TRANSFORM PHOTOCURRENT MEASUREMENTS, Applied physics letters, 71(16), 1997, pp. 2233-2235
Citations number
9
Categorie Soggetti
Physics, Applied
Journal title
Applied physics letters → ACNP
ISSN journal
00036951
Volume
71
Issue
16
Year of publication
1997
Pages
2233 - 2235
Database
ISI
SICI code
0003-6951(1997)71:16<2233:APOHLA>2.0.ZU;2-E
Abstract
We present the results on aging mechanisms acting in high-power laser diode arrays (LDAs) employing Fourier-transform (FT) spectroscopy. The FT spectrometer was used as an excitation source for performing photo current (PC) measurements in two sets of aged LDA samples. The PC spec tra reveal both the evolution of a defect band located in the opticall y active layer as well as modifications of the interband part of the s pectrum upon aging. Such changes represent sensitive quantitative meas ures of the aging status and provide insight into the microscopic chan ges of the device structure upon aging. (C) 1997 American Institute of Physics.