EFFECTS OF ELASTIC AND INELASTIC INTERACTIONS ON PHASE-CONTRAST IMAGES IN TAPPING-MODE SCANNING FORCE MICROSCOPY

Authors
Citation
J. Tamayo et R. Garcia, EFFECTS OF ELASTIC AND INELASTIC INTERACTIONS ON PHASE-CONTRAST IMAGES IN TAPPING-MODE SCANNING FORCE MICROSCOPY, Applied physics letters, 71(16), 1997, pp. 2394-2396
Citations number
21
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
71
Issue
16
Year of publication
1997
Pages
2394 - 2396
Database
ISI
SICI code
0003-6951(1997)71:16<2394:EOEAII>2.0.ZU;2-3
Abstract
The dependence of phase contrast in tapping-mode scanning force micros copy on elastic and inelastic interactions is studied. The cantilever- tip ensemble is simulated as a driven, damped harmonic oscillator. It is found that for tip-sample elastic interactions, phase contrast is i ndependent of the sample's elastic properties, However. phase contrast associated with elastic modulus variations are observed if viscous da mping or adhesion energy hysteresis is considered during tip-sample co ntact. The phase shift versus tip-sample equilibrium separation tvas m easured for a compliant material (polypropylene) and for a stiff sampl e (mica), The agreement obtained between theory and experiment support s the conclusions derived from the model, These results emphasize the relevance of energy dissipating processes at the nanometer scale to ex plain phase contrast imaging in tapping-mode force microscopy. (C) 199 7 American Institute of Physics.