THE EFFECTIVE CHARGE IN SURFACE ELECTROMIGRATION

Citation
Es. Fu et al., THE EFFECTIVE CHARGE IN SURFACE ELECTROMIGRATION, Surface science, 385(2-3), 1997, pp. 259-269
Citations number
32
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
385
Issue
2-3
Year of publication
1997
Pages
259 - 269
Database
ISI
SICI code
0039-6028(1997)385:2-3<259:TECISE>2.0.ZU;2-0
Abstract
The rate of thermal decay of a metastable sawtooth morphology on Si(11 1) is greatly accelerated by the application of a bulk direct current in the ''uphill'' direction. STM measurements of the rate are compared with a mesoscopic theory of surface mass transport incorporating an e ffective surface electromigration force on the diffusing species. Quan titative agreement with the experimental observations is obtained for an effective charge less than or equal to 0.01 electron charge at 900 degrees C. (C) 1997 Elsevier Science B.V.