NONLINEAR EMISSION DYNAMICS FROM SEMICONDUCTOR MICROCAVITIES IN THE NONPERTURBATIVE REGIME

Citation
O. Lyngnes et al., NONLINEAR EMISSION DYNAMICS FROM SEMICONDUCTOR MICROCAVITIES IN THE NONPERTURBATIVE REGIME, Solid state communications, 104(5), 1997, pp. 297-300
Citations number
15
Categorie Soggetti
Physics, Condensed Matter
Journal title
ISSN journal
00381098
Volume
104
Issue
5
Year of publication
1997
Pages
297 - 300
Database
ISI
SICI code
0038-1098(1997)104:5<297:NEDFSM>2.0.ZU;2-3
Abstract
Time-resolved normal-mode-coupling (NMC) oscillations in the nonlinear regime of a semiconductor microcavity with a large splitting to linew idth ratio are studied experimentally using upconversion. A reduction of the modulation depth of the NMC oscillations and reflection dips wi thout a change in the NMC splitting and oscillation period is observed . Microscopic calculations attribute the observed features to excitoni c broadening due to dephasing induced by carrier-carrier and polarizat ion scattering processes. (C) 1997 Elsevier Science Ltd.