Neutron diffraction and quasielastic scattering are well-suited techni
ques for surface melting studies. Indeed, they allow measurements of d
isorder and translational diffusion in the quasi-liquid layer which in
tervenes at the solid-vapour interface (surface) of a crystal, when th
e bulk melting temperature is approached. The principal results of neu
tron scattering studies of van der Waals films deposited on powdered g
raphite and MgO substrates are reviewed.