NEW STRATEGIES FOR TRACE ANALYSES OF ZRO2, SIC AND AL2O3 CERAMIC POWDERS

Citation
F. Kohl et al., NEW STRATEGIES FOR TRACE ANALYSES OF ZRO2, SIC AND AL2O3 CERAMIC POWDERS, Fresenius' journal of analytical chemistry, 359(4-5), 1997, pp. 317-325
Citations number
14
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
359
Issue
4-5
Year of publication
1997
Pages
317 - 325
Database
ISI
SICI code
0937-0633(1997)359:4-5<317:NSFTAO>2.0.ZU;2-#
Abstract
The progress possible in the analysis of refractory powders such as Zr O2, SiC and Al2O3 by the use of new sample preparation, processing and introduction techniques elaborated for AAS, ICP-OES and ICP-MS with l ow and high mass resolution is demonstrated. For optimized sample prep aration techniques based on dissolution of ZrO2, e.g. fusion with (NH4 )(2)SO4, it is shown to what extent impurities present in (NH4)(2)SO4 determine the detection limit. Hydraulic high pressure nebulization wi th and without matrix removal by complexing the impurities with dithio carbamates (Cu, Co, Cr and Ni) or oxine (Fe, Mn and Mo) and fixing the m on a C-18 solid phase for subsequent solid phase extraction coupled with flame atomic absorption was used to determine Fe, Cu, Cr, Mn, Ni, Co and Mo impurities in (NH4)(2)SO4 in the 10-100 ng/g range. Further a method to synthesize (NH4)(2)SO4 with higher purity than some comme rcially available high-purity (NH4)(2)SO4 with respect to Fe, Cu, Cr a nd Mn using high-purity NH3 and chlorosulphonic acid is shown. Reliabl e determinations of Fe and Al at the 100 mu g/g level in ZrO2 with ICP -OES with matrix removal as well as with ICP-MS without matrix removal are reported. For the direct analysis of Al2O3 powders, slurry nebuli zation ICP-MS sample introduction is shown to improve detection Limits and to reduce sample preparation, if the leachable and non-leachable fractions are analyzed separately. For powders such as SiC, the matrix or solvents can cause spectral interferences. Matrix removal is shown to be useful to improve detection limits for the interfered elements. High resolution ICP-MS can be used to control the completeness of mat rix removal techniques and to overcome limitations due to spectral int erferences even in case of complex materials.