AMORPHOUS DEUTERATED CARBON-FILMS IRRADIATED BY SWIFT HEAVY-IONS - INFRARED MEASUREMENTS AND ION-BEAM ANALYSIS

Mixed hydrogenated and deuterated amorphous carbon films have been irr adiated at GANIL in the MeV/amu energy range with an electronic stoppi ng power varying between 1 keV nm(-1) and 13 keV nm(-1). These films r oughly contain 10% of hydrogen and 30% of deuterium. Carbon (C), hydro gen (H) and deuterium (D) contents were determined by Rutherford Backs cattering Spectrometry (RES) and Elastic Recoil Detection Analysis (ER DA), The evolution of C-H and C-D bondings content's was determined by infrared absorption measurements. The main effects due to MeV amu(-1) ion irradiations are the decrease of C-D bondings content and deuteri um relative concentration (D/C atomic ratio) as a function of fluence. A long time after irradiation C-H bondings content and hydrogen relat ive concentration (H/C atomic ratio) increase, The hydrogen absorption cross section is equal to the deuterium effusion cross section within the experimental errors whatever is the physical characterisation (io n beam analysis or infrared absorption), Moreover, both techniques giv e the same cross sections. Hence the following interpretation is propo sed: during irradiation hydrogen and deuterium atoms are ejected from the ion tracks and afterwards are replaced by hydrogen atoms coming fr om the ambient air and diffusing inside the irradiated material along the latent tracks.