We report first-principles calculations of surface and interface energ
ies for AlN(<10(1)over bar 0>) and SiC(<10(1)over bar 0>). On the basi
s of our calculations we predict the atomic structure of the interface
. We find that there is an interaction between the surface and the int
erface mediated by their respective strain fields. Consequently, the f
ormation energy of very thin films of AW on SiC deviates from that exp
ected on the basis of a simple model in which E-film = sigma(film) - s
igma(sub) + E-int. Our results indicate that AW films of thickness 3-4
bilayers will wet the SiC surface.