ANALYSIS OF EXPERIMENTAL ERROR IN HIGH-RESOLUTION ELECTRON-MICROGRAPHS

The experimental errors for recording a high-resolution electron micro graph (HREM) on film are identified and discussed. Both the systematic and random errors are considered and are found to be of roughly the s ame magnitude. However, by making the assumption that images of adjace nt atomic columns in a micrograph are images of identical atomic colum ns, the random errors can be reduced by averaging. Knowledge of the er rors associated with quantifying high-resolution images allows for a m ore rigorous comparison to simulated images.