Jp. Lehan et Ck. Carniglia, EQUIVALENT-CIRCUIT MODEL FOR LARGE-AREA AC MAGNETRON SPUTTERING OF DIELECTRICS, Journal of non-crystalline solids, 218, 1997, pp. 62-67
Some important circuit considerations for ac reactive magnetron sputte
ring of dielectrics are addressed. We start with a simplified circuit
model of a discharge appropriate to the ultrasonic frequency range. Th
e model predicts that a power supply with sufficient secondary leakage
inductance acts as a constant current source. The model accurately re
presents the wave form of the current observed in practice. A large sp
ike observed on the rising edge of the voltage waveform is not predict
ed by the model. Results are presented for reactive sputtering of sili
con-dioxide thin films from cylindrical silicon targets employing a du
al magnetron rotatable cathode powered with an sc power supply operati
ng at about 30 kHz. Single layer SiO2 films were produced over a perio
d of more than 150 h. The lateral film thickness variation was less th
an +/-3% and refractive index stability was +/-0.004 at 545 nm. Sample
s coated after 150 h of continuous cathode operation exhibited small d
ensities of arc-related film inclusions. (C) 1997 Published by Elsevie
r Science B.V.