A method fur the determination of the refractive index close to an int
er-face. valid far inhomogeneous films, is presented as all extension
of the Abeles-Hacskaylo technique used for homogeneous films. Consiste
nt refractive index values, with precision in the third decimal place,
are determined for Ag+ (1.550 +/- 0.001) and K+ (1.522 +/- 0.002) ion
-exchange films on glass, as well as for bare glass substrates (1.509
+/- 0.002), in the neighborhood of their interface with air. The valid
ity of the method is discussed in simple fundamental terms, which, alo
ng with the experimental evidences, indicates applicability to any gra
ded index film, provided an index discontinuity is present ar one of i
ts extremes. (C) 1997 Elsevier Science B.V.