EXTRACTION OF TRAPPED IONS FROM THE TOKYO ELECTRON-BEAM ION-TRAP

Authors
MOTOHASHI K ASADA J CURRELL FJ FUKAMI T HIRAYAMA T MOCHIJI K NAKAMURA N NOJIKAWA E OKAZAKI K OHTANI S SAKURAI M SHIRAISHI H TSURUBUCHI S WATANABE H
Citation
K. Motohashi et al., EXTRACTION OF TRAPPED IONS FROM THE TOKYO ELECTRON-BEAM ION-TRAP, Physica scripta. T, T73, 1997, pp. 368-370
Citations number
10
Categorie Soggetti
Physics
Journal title
Physica scripta. T → ACNP
ISSN journal
02811847
Volume
T73
Year of publication
1997
Pages
368 - 370
Database
ISI
SICI code
0281-1847(1997)T73:<368:EOTIFT>2.0.ZU;2-#
Abstract
A beam line for transporting highly charged ions extracted from the To kyo Electron Beam Ion Trap is being constructed in order to study ion- surface interactions and to inject into secondary ion traps for atomic physics experiments. A basic idea for the design and a computer model ling for the extraction system are described. The results of a test ex periment to detect the total number of ions extracted from the EBIT ar e also reported.